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APPARATUSES LIST

  Apparatus Spec Administrator
(Location)
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1 1-1 X-ray photoelectron spectrometer
ESCA-5800, Ulvac-Phi Inc. 

Mg X-ray source: minimum analysis area, f75µm; monochromatic Al X-ray source: resolution, 0.48eV, ion: Ar, charge neutralisation system,Fronting-type ion; elemental analysis for metal nanoparticles, metal complex, monomolecular film, and solid polymer, etc.

Nobuo Kimizuka

W3-112
2 2-1 Electron state analysis system
Shimazu Corp. 
AXIS-ULTRA

Range: 10~1500 eV, step: below 25meV, Analysis area: >f 15μm Mg/Al dual X-ray source, Power:~450W Ion pump、Degree of vacuum:10-8 Pa

Tsuyohiko Fujigaya

W3-116
3 3-1 Secondary ion mass spectrometer
Analysetechnik GmbH ATOMIKA SIMS 4000

Quadrupole mass spectrometer、First ion beam source: O2 & Ar, acceleration voltage: 3kV-15 kV、analysis area:f250μm - 1000μm、depth resolution:7 – 8 nm Analyses along the thickness direction of polymer alloy, molecular chain, etc.

Keiji Tanaka

W3-212

4
4-1 Surface・interface molucular vibration analysis system
Tokyo Instruments Inc. SpeSpectra-Physics  

Detector:STREAK SCOPE C4334(Hamamatsu Photonics)/Detector:Photomultiplier tube(Hamamatsu Photonics)Pico sec YAG Laser (EKSPLA) Excitation pulse width:1.5 ps、Excitation wavelength:ca. 400 nm、Polarization option available, measurement range:1500~4000 cm-1

Keiji Tanaka

W3-310
5 5-1 Laser Raman Microscope system
Raman-touch VIS-NIR-KUF Nanophoton Corp.

・Excitation lasers: 532nm、633nm、785nm
・Space resolution:>350nm・ultrafast imaging by line scan
・able to measure from 100 cm-1
・a space resolution of 1 mm along z direction・spectrum resolution(FWHM)=1.2 cm-1 (@785nm、1200gr/mm)

Tsuyohiko Fujigaya

W3-607

5
5-3 Micro-Raman RXN system
Kaiser Optical Systems, Inc.
RAMAN RXN Systems

HoloPlexTM, transmission grating、Notch filter, F:1.8 Laser: 785nm/400mW CCD detector with cooling system Wavelength range: 100~3450cm-1 resolution 4cm-1

Tsuyohiko Fujigaya

W3-607
6 6-1 Laser Raman spectrometer
JASCO Corp. NRS-3100KK

Wavelength range:50~8,000 cm-1 resolution:1 cm-1    Excitation laser wavelength:532 nm, 785 nm Excitation laser wavelength:532 nm, 785 nm

Nobuo Kimizuka

W3-114
7 7-1 UV-Vis-NIR spectrometer

Shimazu Corp.SolidSpec-3700DUV

New ultraviolet area measurable、InGaAs detector available、Temperature adjustable Cell changer available(able to measure multiple samples)measuring temperature adjustable

Tsuyohiko Fujigaya

W3-115
7 7-2 IR/NIR absorption spectrometer
PerkingElmer Co.,Ltd
Spotlight400 IR/NIR imaging system, 400,

Measurement range:7800 - 650cm-1 , ATR-IR measurement available at 4500~680 cm-1  IR microscope (imaging)、imaging resolution: 6.25 μm~

Tsuyohiko Fujigaya

W3-115
8 8-1 UV-Vis-NIR spectrometer
JASCO Corp. V-670

Abs<7 , Integrating spheres, temperature adjustable, solid & liquid samples, diffuse reflectance spectroscopy

Tsuyohiko Fujigaya

W3-115
9 9-1 Molecular structure analysis system based on HPLC

HPLC:Shimazu Corp. nexeraX2

MS:Bruker Corp.    micrOTOF-QIII

CD:JASCO Corp. J-1500

DLS-8000DL
Otsuka Electronics Co., Ltd

Molecular structure can be exactly determined by this system based on the most advanced HPLC combined with spectrometer, electrochemical detector, mass spectrometer, light scattering detector in line.

Tsuyohiko Fujigaya

W3-113

 




10 10-1 Fluorolog-NIR spectrofluorometer 
SPEX Fluorolog-NIR spectrophotometer, Horiba Ltd.
Range:800-1600 nm or 300-850nm   Optional temperature adjustable cell cooling system (cooled by liquid N2) Hiroyuki Furuta

W3-708
11 11-1 Spectrofluorometer 
NanoLog FL-322, Horiba Ltd.

Obtain spectra and exciting light-luminance imaging simultaneously temperature adjustable excitation:700-1000nm, Fluorescence:1100-2000 nm Measurement of chirality of carbon nanotube, evaluation of NIR-luminescent semiconductor

Tsuyohiko Fujigaya

W3-612
13 13-1 Nuclear magnetic resonance spectrometer
Bruker Corp. 
Avance 500MHz
Sensitivity:13C≧2500:1 (ASTM) 1H ≧3000:1 (0.1% Ethylbenzene、over 200 Hz noise) Pulse width:13C Pulse width≦10μs  1H Pulse width≦10μs Measurement nuclei:1H、13C Temperature: 0℃~+80℃ Yoshio Hisaeda

W3-109
14 14-1 Mass spectrometer
JEOL 
JMS-T100CS
Parallel measurement of ESI/CSI Ionization at low temperature(-100℃) Yoshio Hisaeda

W3-210
15 15-1 MALDI-TOF mass spectrometer
BRUKER Corp.
Autoflex III

Resolution>1000 for protein sample under linear mode Mass resolution
<ca.100ppm:、<5ppm for peptide
mass region(refrection mode)

Rika Miki

W3-114
15 15-2 Ultracentrifuge for separation
Hitachi Koki Co., Ltd.
himac CS100GXL
Maximum acceleration of gravity:
Maximum acceleration of gravity: 604,000g
Tsuyohiko Fujigaya

W3-612
15
15-3 Preparative HPLC system
Japan Analytical Industry Co., Ltd. LC-908-C60
Preparative: gram order Possible for large scale preparation in case of using big column Injection amount: 10 mL Tsuyohiko Fujigaya

W3-213
16 16-1 Scanning Probe Microscope 
Agilent Technologies
PicoPlus 5500

Horizontal direction resolution:0.14 nm Vertical direction resolution:0.01 nm Morphology observation for Latex、emulsion、micelle、gel、sol、protein、nucleic acid、virus、polysaccharide、liposome、vesicle、cell, inorganic polymer, ceramics, magnetic materials、metal colloid

Nobuo Kimizuka

W3-113
16 16-2 Surficial electrical resistivity meter
Mitsubishi Chemical Corp.  
Loresta-GP
Four-probe 4 methods galvanostatic measurement、 Measurement range: 10-3~107Ω 4 probes in a row Bulk conductivity and resistivity calculated from the shape of sample Tsuyohiko Fujigaya

W3-612
16
16-3 Surface profiler
Veeco Instruments Inc.  
Dektak 6M
Vertical direction resolution 1Å~40Å ; Chihaya Adachi

Center For
Co-Evolutional
Social Systems
 3F 311
17 17-1 Scanning Probe Microscope
Shimazu Corp. SPM-9600
Resolution: horizontal: 0.2 nm vertical: 0.01 nm measurement mode:contact、dynamic, phase   Tsuyohiko fujigaya

W3-113
17 17-2 Scanning Probe Microscope
Veeco社製 nanoscopeIIIa   
Mode:S11(complex reflection coefficient)dC/dV
Frequency:2GHz~6GHz
Capacitance:1.2aF 
Dynamic range:1014cm3~1020cm3 Space resolution:<2nm Cantilever:solid metal probe 
Scan range:XY axes:>90μm×90 μm Z axis: >8 μm
Tsuyohiko Fujigaya

W3-605
19 19-1 Multi-functional Atomic force microscope equipped with environmental control unit
SII NanoTechnology Inc.
SPI3800N
Environment:atmosphere, liquid, vacuum, gas atmosphere Temperature control: automatically heating・cooling (-120~250℃) phase, friction, viscoelasticity, current、etc. Keiji Tanaka

W3-111
20 20-1 Cold field emission scanning electron microscope
Hitachi High-Technologies Corp.
SU9000
Simultaneous observation of SEM(space resolution: 0.4 nm) & STEM (space resolution: 0.34nm) Low acceleration voltage: <30kV・cold FE electron gun・high resolution element mapping by EDS・observation of frozen water-containing sample Tsuyohiko Fujigaya

W3-114
20 20-2 3D-SEM system
KEYENCE Corp. 
VE-980

Acceleration voltage: 0.5-20kV Observation of organic/inorganic/composite materias at low acceleration voltage (>0.5 kV)、observation of the outerest surface even for insulator (depends on sample)、resolution: 30 nm

Tsuyohiko Fujigaya

W3-114
21
21-1 Scanning electron microscope
Hitachi Corp. S-5000

Resolution:1.5nm(15kV)、5.0nm(1kV) magnitute:20~1000,000×
sample size:maximum 10mm acceleration voltage:0.5kV~30kV 

Nobuo Kimizuka

W3-114
22
22-1 Transmission Electron Microscope
JEOL, Ltd.  JEM-2010 
Maximum acceleration voltage:200kV、point resolution:0.23nm、acceleration voltage:120,200kV Tsuyohiko Fujigaya

W3-112
22 22-2 Atmospheric Scanning Electron microscope
JOEL,Ltd. 
JASM-6200
Observation for liquid (atmospheric pressure) 10~100,000×;
Bright field、fluorescent observation (optical microscope) Electromagnetic two-stage zoom condenser lens
Tsuyohiko Fujigaya

W3-114
23 23-1 Zeta-potential and particle analyzer
Otsuka Electronics Co., Ltd.
ELSZ-2

Capable of measuring the surface Zeta-potential of substrate, substrate and film with special cell for planar sample with wide particle size range for measurement (0.6-7000nm) wide concentration range (0.001-40%)

Tsuyohiko Fujigaya

W3-607
24 24-1 Zeta-potential and particle analyzer
Malvern Instruments 
Nano-Zs

Zeta-potential 3nm~10mm Particle or molecule size, parallel diffusion, electrophoretic mobility, Zeta-potential for particle with high or low concentration, viscosity, viscoelasticity, concentration, molecular weight, A2, KD of protein, polymer,nanoparticle, and colloid

Masahiro Goto

W3-514
25 25-1 Particle Sizer and Zeta Potential Analyzer
Malvern Instruments 
Zetasizer Nano ZS 
Particle distribution、Zeta-potential、molecular weight measurement Yoshiki Katayama

W3-501
26 26-1 Intelligent X-ray diffraction (XRD) system
Rigaku Corp.
SmartLab

2D semiconductor detector CALSA ultrahigh resolution spiral analyzer low angle analyzer Qualitative analysis, crystallinity estimation, crystalline size measurement for powder sample

Tsuyohiko Fujigaya

W3-115
27 27-1 Single crystal X-ray structure analysis apparatus
Bruker Corp.
SMART APEX
CCD analysis with high sensitivity and accuracy for the structure of complicated complex and organics Yoshio Hisaeda

W3-204

28 28-1 Micro calorimeter
Micro Cal Inc. 
VP-ITC

Analysis for the interaction of biomass Temperature range of measurement: 2~80℃、cell volume: 200 μl、titrating amount: 0.1~40 μl

Tsuyohiko Fujigaya

Engineering Department Experimental Facilities
2F-208
28 28-2 Vapor pressure osmometer
Gonotec
OSMOMAT 070
Molecular weight:toluene:50~50,000 Dalton (g/mol) pure water:50~5,000 Dalton (g/mol) Nobuo Kimizuka

W3-113
28 28-3 Vapor pressure osmometer
KNAUER
Vapor Pressure Osmometer K-7000
Molecular weight: water,< 10,000 g/mol; Organic solvent:40-40,000 g/mol Seiji Ogo

W3-904
29 29-1 Molecular structure analysis system Simulation and visualization of biomolecule and polymer,parallel computing and GPU computing,modeling, analyzing, and calculation based on nonempirical molecular orbital method、density function theory computation, molecular dynamics, etc. Tsuyohiko Fujigaya

W3-115
30 30-1 Fuel cell evaluation systems
TOYO Corp.,
AutoPEM-ER01and 02,  
Tester Sangyo Co,. Ltd.  
Hotpress SA-501
Fuel supply apparatus, H2, 1000 Ncc/min ~、Air, 2000 Ncc/min~)
DC bias potential: 5 V~、
Current ±2 A~、
Auto potential sweep: 6 mV~60 V/min Sampling:current~1pA,potential~1μV
Tsuyohiko Fujigaya

W4-112
30 30-2 Catalyst activity/surface area measurement system
MicrotracBel Corp.
BELSORP-miniⅡ 
BELCAT-B
Specific area:0.01 m2/g~、
pore size distribution(0.7~200 nm) Pressure meter: 5 set、0~133 kPa、±0.25%、resolution: 4 Pa open environment (room temperature~1200 ℃) TCD detector  
Tsuyohiko Fujigaya

Engineering Department Experimental Facilities104
31 31-1 Solar cell characterization system
Bunkoukeiki Co.,Ltd 
SRO-25GD
Light source:xenon lamp 500W Wavelength range:300~1150 nm White light(AM1.5G)IV characteristics against radiation monochromatic light radiation for spectroscopy and quantum efficiency measurement Takuma Yasuda

INAMORI Frontier Research Center 302